TY - JOUR
T1 - The role of terminal oxide structure and properties in nanothermite reactions
AU - Mily, E. J.
AU - Oni, A.
AU - Lebeau, J. M.
AU - Liu, Y.
AU - Brown-Shaklee, H. J.
AU - Ihlefeld, J. F.
AU - Maria, J. P.
N1 - Funding Information:
The authors would like to thank Ralph Athenian and the U.S. Army Research Office for continued financial support. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000 .
PY - 2014/7/1
Y1 - 2014/7/1
N2 - In this report, thin films of copper oxide, a common thermite oxidant, and varying metallic species (Al, Zr, and Mg) were deposited in an alternating layered geometry on sapphire by magnetron sputtering. Keeping stoichiometric equivalence, the effects of varying metallic constituents were studied with respect to their onset reaction temperature and energy output. Reaction progression was characterized by a systematic step wise vacuum anneal followed by subsequent ex situ X-ray diffraction, and differential thermal analysis. It was found that reaction temperature depends heavily on the terminal oxide's diffusion properties, showing a correlation
AB - In this report, thin films of copper oxide, a common thermite oxidant, and varying metallic species (Al, Zr, and Mg) were deposited in an alternating layered geometry on sapphire by magnetron sputtering. Keeping stoichiometric equivalence, the effects of varying metallic constituents were studied with respect to their onset reaction temperature and energy output. Reaction progression was characterized by a systematic step wise vacuum anneal followed by subsequent ex situ X-ray diffraction, and differential thermal analysis. It was found that reaction temperature depends heavily on the terminal oxide's diffusion properties, showing a correlation
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U2 - 10.1016/j.tsf.2014.05.005
DO - 10.1016/j.tsf.2014.05.005
M3 - Article
AN - SCOPUS:84901750813
SN - 0040-6090
VL - 562
SP - 405
EP - 410
JO - Thin Solid Films
JF - Thin Solid Films
ER -