@inproceedings{74d1ce8aab7542c9896db9a572e9d9b2,
title = "The substrate noise detector for noise tolerant mixed-signal IC",
abstract = "A new type of substrate noise detector is proposed. It is embedded in a mixed-signal IC and monitors the level of substrate noise. Voltage comparators are used to detect errors and a counter tracks the number of errors periodically. From the number of errors, the level of substrate noise is estimated using the probabilistic approach. This type of detector is useful in that it monitors substrate noise in real-time. Using this, various adaptive algorithms become feasible to reduce substrate noise. The details of the detector circuits are presented.",
author = "Kang, {Byung Tae} and N. Vijaykrishnan and Irwin, {M. J.} and Duarte, {I. D.}",
note = "Publisher Copyright: {\textcopyright} 2003 IEEE.; IEEE International SOC Conference, SOCC 2003 ; Conference date: 17-09-2003 Through 20-09-2003",
year = "2003",
doi = "10.1109/SOC.2003.1241520",
language = "English (US)",
series = "Proceedings - IEEE International SOC Conference, SOCC 2003",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "279--280",
editor = "Ha, {Dong S.} and Richard Auletta and John Chickanosky",
booktitle = "Proceedings - IEEE International SOC Conference, SOCC 2003",
address = "United States",
}