The Swift-XRT imaging performances and serendipitous survey

A. Moretti, M. Perri, M. Capalbi, A. F. Abbey, L. Angelini, A. Beardmore, D. N. Burrows, S. Campana, G. Chincarini, O. Citterio, G. Cusumano, P. A. Evans, P. Giommi, M. R. Goad, O. Godet, C. Guidorzi, D. Grupe, J. E. Hill, J. A. Kennea, V. La ParolaV. Mangano, T. Mineo, D. C. Morris, J. A. Nousek, J. P. Osborne, K. L. Page, C. Pagani, J. Racusin, P. Romano, G. Tagliaferri, F. Tamburelli

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations

Abstract

We are exploiting the Swift X-ray Telescope (XRT) deepest GRB follow-up observations to study the cosmic X-Ray Background (XRB) population in the 0.2-10 keV energy band. We present some preliminary results of a serendipitous survey performed on 221 fields observed with exposure longer than 10 ks. We show that the XRT is a profitable instrument for surveys and that it is particularly suitable for the search and observation of extended objects like clusters of galaxies. We used the brightest serendipitous sources and the longest observations to test the XRT optics performance and the background characteristics all over the field of view, in different energy bands during the first 2.5 years of fully operational mission.

Original languageEnglish (US)
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy III
PublisherSPIE
ISBN (Print)9780819468369
DOIs
StatePublished - 2007
EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy III - San Diego, CA, United States
Duration: Aug 29 2007Aug 30 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6688
ISSN (Print)0277-786X

Other

OtherOptics for EUV, X-Ray, and Gamma-Ray Astronomy III
Country/TerritoryUnited States
CitySan Diego, CA
Period8/29/078/30/07

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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