Theory of scanning probe microscopy

Vincent Meunier; Philippe Lambin

doi:10.1007/978-0-387-28668-6_17

Theory of scanning probe microscopy

Vincent Meunier, Philippe Lambin

Engineering Science and Mechanics

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

One of the central difficulties of devising new nanostructures is to monitor characterization and manipulation processes at extreme dimensions. In that respect, scanning probe microscopes (SPMs) constitute an important class of experimental tools for imaging the local atomic, mechanical, electronic, and transport properties of samples at dimensions ranging from the mesoscale to the nanoscale.

Original language	English (US)
Title of host publication	Scanning Probe Microscopy
Publisher	Springer New York
Pages	455-479
Number of pages	25
Volume	2
ISBN (Print)	0387286675, 9780387286679
DOIs	https://doi.org/10.1007/978-0-387-28668-6_17
State	Published - 2007

All Science Journal Classification (ASJC) codes

General Materials Science
General Chemistry

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10.1007/978-0-387-28668-6_17

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BT - Scanning Probe Microscopy

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Theory of scanning probe microscopy

Abstract

All Science Journal Classification (ASJC) codes

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