Theory of the X‐ray and optical properties of polysulphur nitride

W. I. Friesen; D. B. Litvin; B. Bergersen

doi:10.1002/pssb.2220850236

Theory of the X‐ray and optical properties of polysulphur nitride

W. I. Friesen, D. B. Litvin, B. Bergersen

Division of Science (Berks)

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The extended Hückel method is used to calculate various band structure dependent properties of polysulphur nitride (SN)_x. X‐ray emission spectra are computed and are presented as a means of differentiating between conflicting reported band structures. The interband contribution to the imaginary part of the dielectric function is also calculated and is discussed in relation to experimental results quoted in the literature.

Original language	English (US)
Pages (from-to)	715-722
Number of pages	8
Journal	physica status solidi (b)
Volume	85
Issue number	2
DOIs	https://doi.org/10.1002/pssb.2220850236
State	Published - Feb 1 1978

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1002/pssb.2220850236

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title = "Theory of the X‐ray and optical properties of polysulphur nitride",

abstract = "The extended H{\"u}ckel method is used to calculate various band structure dependent properties of polysulphur nitride (SN)x. X‐ray emission spectra are computed and are presented as a means of differentiating between conflicting reported band structures. The interband contribution to the imaginary part of the dielectric function is also calculated and is discussed in relation to experimental results quoted in the literature.",

author = "Friesen, {W. I.} and Litvin, {D. B.} and B. Bergersen",

year = "1978",

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T1 - Theory of the X‐ray and optical properties of polysulphur nitride

AU - Friesen, W. I.

AU - Litvin, D. B.

AU - Bergersen, B.

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Y1 - 1978/2/1

N2 - The extended Hückel method is used to calculate various band structure dependent properties of polysulphur nitride (SN)x. X‐ray emission spectra are computed and are presented as a means of differentiating between conflicting reported band structures. The interband contribution to the imaginary part of the dielectric function is also calculated and is discussed in relation to experimental results quoted in the literature.

AB - The extended Hückel method is used to calculate various band structure dependent properties of polysulphur nitride (SN)x. X‐ray emission spectra are computed and are presented as a means of differentiating between conflicting reported band structures. The interband contribution to the imaginary part of the dielectric function is also calculated and is discussed in relation to experimental results quoted in the literature.

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VL - 85

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JF - physica status solidi (b)

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ER -

Theory of the X‐ray and optical properties of polysulphur nitride

Abstract

All Science Journal Classification (ASJC) codes

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