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Thermal characterization of gallium oxide Schottky barrier diodes
Bikramjit Chatterjee
, Asanka Jayawardena
, Eric Heller
,
David W. Snyder
, Sarit Dhar
,
Sukwon Choi
Mechanical Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
51
Scopus citations
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Keyphrases
Ga2O3
100%
Thermal Characterization
100%
Schottky Barrier Diode
100%
Heat Generation
40%
Full Potential
20%
Design Techniques
20%
Power Electronics
20%
Temperature Field
20%
Lightly Doped
20%
Thermal Management Applications
20%
Thermal Conductivity
20%
Material System
20%
Thermoelectric Properties
20%
4H-SiC
20%
Device-independent
20%
Diode Structures
20%
Diode
20%
Self-heating
20%
Generation Power
20%
Bias Conditions
20%
Reverse Bias
20%
Gallium Nitride
20%
Thermal Issues
20%
Thermoreflectance Thermal Imaging
20%
Drift Layer
20%
Wide Bandgap Devices
20%
Infrared Thermal Microscopy
20%
Coupled Electro-thermal Modeling
20%
Thermographic Method
20%
Optical Thermography
20%
Engineering
Heat Generation
100%
Thermal Characterization
100%
Schottky Barrier Diode
100%
Experimental Result
50%
Nitride
50%
Material System
50%
Power Electronic Device
50%
Design Technique
50%
Reverse Bias
50%
Forward Voltage
50%
Electric Field
50%
Temperature Distribution
50%
Band Gap
50%
Poor Thermal Conductivity
50%
Material Science
Oxide Compound
100%
Schottky Barrier
100%
Gallium
100%
Electronic Circuit
50%
Gallium Nitride
50%
Anode
50%
Thermal Conductivity
50%
Silicon Carbide
50%