Thermal degradation of relaxor-based piezoelectric ceramics

J. T. Fielding, S. J. Jang, T. R. Shrout

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The effect of exposure to elevated temperatures on dielectric and piezoelectric properties near the morphotropic phase boundary is examined, and the mechanisms of thermal degradation involved as compared to normal ferroelectric materials are discussed. The thermal degradation of dielectric and piezoelectric properties was investigated for relaxor ferroelectric compositions in the (1-x)Pb(Mg1/3Nb2/3)O3- (x)PbTiO3 family near the morphotropic phase boundary. Degradations of the radial coupling factor piezoelectric charge coefficient and mechanical quality factor were observed to be less than expected based on the temperature dependence of the polarization.

Original languageEnglish (US)
Title of host publication90 IEEE 7 Int Symp Appl Ferroelectr
PublisherPubl by IEEE
Number of pages4
ISBN (Print)0780301900
StatePublished - Dec 1 1992
Event1990 IEEE 7th International Symposium on Applications of Ferroelectrics - Champaign, IL, USA
Duration: Jun 6 1990Jun 8 1990

Publication series

Name90 IEEE 7 Int Symp Appl Ferroelectr


Other1990 IEEE 7th International Symposium on Applications of Ferroelectrics
CityChampaign, IL, USA

All Science Journal Classification (ASJC) codes

  • Engineering(all)


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