THERMOPHYSICAL PROPERTY MEASUREMENT OF GAN-ON-ALN WAFERS FOR NEXT-GENERATION RF DEVICE TECHNOLOGIES
- Husam Walwil
- , Daniel C. Shoemaker
- , Yiwen Song
- , Kyuhwe Kang
- , Nathaniel S. McIlwaine
- , Michael L. Schuette
- , James S. Tweedie
- , Scott T. Sheppard
- , Jon Paul Maria
- , Sukwon Choi
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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