Abstract
In this paper, application of thick photorefractive(PR) crystal to wavelength-multiplexed reflectiontype matched filter is described. The Bragg diffraction limitation and the shift-invariant property using thick volume PR crystal are discussed, in which we see that the Bragg diffraction is severely limited by the thickness of the crystal. To alleviate the Bragg limitation in terms of shift tolerance, we have shown that the reflection-Type wavelength-multiplexed PR filter can be used. Experimental confirmation of these findings are also provided.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 360-371 |
| Number of pages | 12 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 2237 |
| DOIs | |
| State | Published - Mar 1 1994 |
| Event | Optical Pattern Recognition V 1994 - Orlando, United States Duration: Apr 4 1994 → Apr 8 1994 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering