Thickness characterization of atomically thin WSe2 on epitaxial graphene by low-energy electron reflectivity oscillations

Sergio C. De La Barrera, Yu Chuan Lin, Sarah M. Eichfeld, Joshua A. Robinson, Qin Gao, Michael Widom, Randall M. Feenstra

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Fingerprint

Dive into the research topics of 'Thickness characterization of atomically thin WSe2 on epitaxial graphene by low-energy electron reflectivity oscillations'. Together they form a unique fingerprint.

Material Science

Keyphrases