Thickness dependence of dielectric nonlinearity of lead zirconate titanate films

Ichiro Fujii; Eunki Hong; Susan Trolier-Mckinstry

doi:10.1109/TUFFC.2010.1610

Thickness dependence of dielectric nonlinearity of lead zirconate titanate films

Ichiro Fujii
, Eunki Hong
, Susan Trolier-Mckinstry

Research output: Contribution to journal › Article › peer-review

43 Scopus citations

Abstract

The first-order reversal curves (FORC) distribution of PbZr0.52Ti0.48O3 thin films was characterized as a function of film thickness. It was found that the thickness dependence of the small-field dielectric constant is due primarily to differences in the domain wall contributions to the properties. The irreversible FORC distribution decreased and the switching fields increased as the thickness decreased; this is compatible with reported Rayleigh analyses. The polarization-electric field data and the ac field dependence of the dielectric constant were modeled using the FORC distributions, and were found to give a good fit to the experimental results. Some discrepancies remain in the high-field dielectric constant, probably caused by its definition.

Original language	English (US)
Article number	5529460
Pages (from-to)	1717-1723
Number of pages	7
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume	57
Issue number	8
DOIs	https://doi.org/10.1109/TUFFC.2010.1610
State	Published - Aug 2010

All Science Journal Classification (ASJC) codes

Instrumentation
Acoustics and Ultrasonics
Electrical and Electronic Engineering

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10.1109/TUFFC.2010.1610

Cite this

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title = "Thickness dependence of dielectric nonlinearity of lead zirconate titanate films",

abstract = "The first-order reversal curves (FORC) distribution of PbZr0.52Ti0.48O3 thin films was characterized as a function of film thickness. It was found that the thickness dependence of the small-field dielectric constant is due primarily to differences in the domain wall contributions to the properties. The irreversible FORC distribution decreased and the switching fields increased as the thickness decreased; this is compatible with reported Rayleigh analyses. The polarization-electric field data and the ac field dependence of the dielectric constant were modeled using the FORC distributions, and were found to give a good fit to the experimental results. Some discrepancies remain in the high-field dielectric constant, probably caused by its definition.",

author = "Ichiro Fujii and Eunki Hong and Susan Trolier-Mckinstry",

note = "Funding Information: Manuscript received october 11, 2009; accepted april 14, 2010. This work was supported by the center for dielectric studies at the Pennsylvania state University and a national security science and Engineering Faculty Fellowship.",

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AU - Fujii, Ichiro

AU - Hong, Eunki

AU - Trolier-Mckinstry, Susan

N1 - Funding Information: Manuscript received october 11, 2009; accepted april 14, 2010. This work was supported by the center for dielectric studies at the Pennsylvania state University and a national security science and Engineering Faculty Fellowship.

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AB - The first-order reversal curves (FORC) distribution of PbZr0.52Ti0.48O3 thin films was characterized as a function of film thickness. It was found that the thickness dependence of the small-field dielectric constant is due primarily to differences in the domain wall contributions to the properties. The irreversible FORC distribution decreased and the switching fields increased as the thickness decreased; this is compatible with reported Rayleigh analyses. The polarization-electric field data and the ac field dependence of the dielectric constant were modeled using the FORC distributions, and were found to give a good fit to the experimental results. Some discrepancies remain in the high-field dielectric constant, probably caused by its definition.

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M1 - 5529460

ER -

Thickness dependence of dielectric nonlinearity of lead zirconate titanate films

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