Thickness dependence of the properties of epitaxial MgB2 thin films grown by hybrid physical-chemical vapor deposition

A. V. Pogrebnyakov; J. M. Redwing; J. E. Jones; X. X. Xi; S. Y. Xu; Qi Li; V. Vaithyanathan; D. G. Schlom

doi:10.1063/1.1583852

Thickness dependence of the properties of epitaxial MgB₂ thin films grown by hybrid physical-chemical vapor deposition

A. V. Pogrebnyakov
, J. M. Redwing
, J. E. Jones
, X. X. Xi
, S. Y. Xu
, Qi Li
, V. Vaithyanathan
, D. G. Schlom

Research output: Contribution to journal › Article › peer-review

107 Scopus citations

Abstract

An analysis of the thickness dependence of the properties of epitaxial MgB₂ thin films grown by hybrid-chemical vapor deposition was presented. The film deposition rate was found to depend linearly on the concentration of B₂H₆. It was found that the superconducting and normal-state properties of the film were determined by the film thickness.

Original language	English (US)
Pages (from-to)	4319-4321
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	24
DOIs	https://doi.org/10.1063/1.1583852
State	Published - Jun 16 2003

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1583852

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abstract = "An analysis of the thickness dependence of the properties of epitaxial MgB2 thin films grown by hybrid-chemical vapor deposition was presented. The film deposition rate was found to depend linearly on the concentration of B2H6. It was found that the superconducting and normal-state properties of the film were determined by the film thickness.",

author = "Pogrebnyakov, \{A. V.\} and Redwing, \{J. M.\} and Jones, \{J. E.\} and Xi, \{X. X.\} and Xu, \{S. Y.\} and Qi Li and V. Vaithyanathan and Schlom, \{D. G.\}",

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AU - Pogrebnyakov, A. V.

AU - Redwing, J. M.

AU - Jones, J. E.

AU - Xi, X. X.

AU - Xu, S. Y.

AU - Li, Qi

AU - Vaithyanathan, V.

AU - Schlom, D. G.

PY - 2003/6/16

Y1 - 2003/6/16

N2 - An analysis of the thickness dependence of the properties of epitaxial MgB2 thin films grown by hybrid-chemical vapor deposition was presented. The film deposition rate was found to depend linearly on the concentration of B2H6. It was found that the superconducting and normal-state properties of the film were determined by the film thickness.

AB - An analysis of the thickness dependence of the properties of epitaxial MgB2 thin films grown by hybrid-chemical vapor deposition was presented. The film deposition rate was found to depend linearly on the concentration of B2H6. It was found that the superconducting and normal-state properties of the film were determined by the film thickness.

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DO - 10.1063/1.1583852

M3 - Article

AN - SCOPUS:0038450109

SN - 0003-6951

VL - 82

SP - 4319

EP - 4321

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 24

ER -

Thickness dependence of the properties of epitaxial MgB₂ thin films grown by hybrid physical-chemical vapor deposition

Abstract

All Science Journal Classification (ASJC) codes

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