Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films

Zheng Li; Jiamian Hu; Li Shu; Ya Gao; Yang Shen; Yuanhua Lin; C. W. Nan

doi:10.1063/1.3682764

Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films

Zheng Li, Jiamian Hu, Li Shu, Ya Gao, Yang Shen, Yuanhua Lin, C. W. Nan

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

The converse magnetoelectric (ME) effect was investigated in bi-layered Ni/Pb(Zr _0.52Ti _0.48)O ₃ (PZT) thin films grown on Si substrates, with different thicknesses of Ni thin layers. By using an AC-mode magneto-optical Kerr effect method, it was revealed that the electric-voltage induced magnetization variation was dependent on the thickness of the Ni thin layer. The results showed that the Ni/PZT bilayered films with thick (about 40 nm) Ni films presented a dominative strain mediated ME coupling, whereas an interface-charge and strain co-mediated ME coupling might coexist in the Ni/PZT bilayered films with decreasing thickness (e.g., about 10 nm) of Ni films.

Original language	English (US)
Article number	033918
Journal	Journal of Applied Physics
Volume	111
Issue number	3
DOIs	https://doi.org/10.1063/1.3682764
State	Published - Feb 1 2012

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.3682764

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title = "Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films",

abstract = "The converse magnetoelectric (ME) effect was investigated in bi-layered Ni/Pb(Zr 0.52Ti 0.48)O 3 (PZT) thin films grown on Si substrates, with different thicknesses of Ni thin layers. By using an AC-mode magneto-optical Kerr effect method, it was revealed that the electric-voltage induced magnetization variation was dependent on the thickness of the Ni thin layer. The results showed that the Ni/PZT bilayered films with thick (about 40 nm) Ni films presented a dominative strain mediated ME coupling, whereas an interface-charge and strain co-mediated ME coupling might coexist in the Ni/PZT bilayered films with decreasing thickness (e.g., about 10 nm) of Ni films.",

author = "Zheng Li and Jiamian Hu and Li Shu and Ya Gao and Yang Shen and Yuanhua Lin and Nan, {C. W.}",

note = "Funding Information: This work was supported by the National Basic Research Program of China (Grant No. 2009CB623303) and the NSF of China (Grant Nos. 50921061 and 50832003).",

year = "2012",

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doi = "10.1063/1.3682764",

language = "English (US)",

volume = "111",

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TY - JOUR

T1 - Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films

AU - Li, Zheng

AU - Hu, Jiamian

AU - Shu, Li

AU - Gao, Ya

AU - Shen, Yang

AU - Lin, Yuanhua

AU - Nan, C. W.

N1 - Funding Information: This work was supported by the National Basic Research Program of China (Grant No. 2009CB623303) and the NSF of China (Grant Nos. 50921061 and 50832003).

PY - 2012/2/1

Y1 - 2012/2/1

N2 - The converse magnetoelectric (ME) effect was investigated in bi-layered Ni/Pb(Zr 0.52Ti 0.48)O 3 (PZT) thin films grown on Si substrates, with different thicknesses of Ni thin layers. By using an AC-mode magneto-optical Kerr effect method, it was revealed that the electric-voltage induced magnetization variation was dependent on the thickness of the Ni thin layer. The results showed that the Ni/PZT bilayered films with thick (about 40 nm) Ni films presented a dominative strain mediated ME coupling, whereas an interface-charge and strain co-mediated ME coupling might coexist in the Ni/PZT bilayered films with decreasing thickness (e.g., about 10 nm) of Ni films.

AB - The converse magnetoelectric (ME) effect was investigated in bi-layered Ni/Pb(Zr 0.52Ti 0.48)O 3 (PZT) thin films grown on Si substrates, with different thicknesses of Ni thin layers. By using an AC-mode magneto-optical Kerr effect method, it was revealed that the electric-voltage induced magnetization variation was dependent on the thickness of the Ni thin layer. The results showed that the Ni/PZT bilayered films with thick (about 40 nm) Ni films presented a dominative strain mediated ME coupling, whereas an interface-charge and strain co-mediated ME coupling might coexist in the Ni/PZT bilayered films with decreasing thickness (e.g., about 10 nm) of Ni films.

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JF - Journal of Applied Physics

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Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films

Abstract

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