Abstract
This paper investigates the performance of ultra-thin TFTs by modeling devices of varying thickness and have fabricates ultra-thin a-Si:H TFTs suitable for use in AMLCDs. It is shown that the ultra-thin active layer TFT structure can provide improved throughput, simplified processing, higher channel conductance, and current saturation characteristics equal to or better than current devices. In addition, fabrication of thin channel layer devices with doped contact regions is also possible and is directly compatible with commonly used a-Si:H TFT AMLCD processing.
Original language | English (US) |
---|---|
Pages | 70-71 |
Number of pages | 2 |
DOIs | |
State | Published - 1996 |
Event | Proceedings of the 1996 54th Annual Device Research Conference Digest, DRC - Santa Barbara, CA, USA Duration: Jun 24 1996 → Jun 26 1996 |
Other
Other | Proceedings of the 1996 54th Annual Device Research Conference Digest, DRC |
---|---|
City | Santa Barbara, CA, USA |
Period | 6/24/96 → 6/26/96 |
All Science Journal Classification (ASJC) codes
- General Engineering