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Thin film stress from nonspherical substrate bending measurements
Sinjiroo Fahnline
, Christine B. Masters
, N. J. Salamon
College of Engineering
Engineering Science and Mechanics
Research output
:
Contribution to journal
›
Article
›
peer-review
43
Scopus citations
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Dive into the research topics of 'Thin film stress from nonspherical substrate bending measurements'. Together they form a unique fingerprint.
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Keyphrases
Non-spherical
100%
Thin Film Stress
100%
Substrate Bending
100%
Bending Measurement
100%
Deposition Stress
100%
Wafer
66%
Large Deflection
66%
Thin Film Deposition
33%
Direct Current
33%
Deposition Conditions
33%
Substrate Material
33%
Film Materials
33%
Magnetron
33%
Out-of-plane Deflection
33%
Nonlinear Bending
33%
Nonlinear Theory
33%
Algebraic Solution
33%
Small Deflection
33%
Ta Films
33%
Ellipsoidal Surface
33%
Bending Model
33%
Engineering
Thin Films
100%
Limitations
50%
Polycarbonate
50%
Direct Current
50%
Magnetron
50%
Deposition Condition
50%
Substrate Material
50%
Film Material
50%
Nonlinear Theory
50%
Material Science
Film
100%
Thin Films
100%
Polycarbonate
33%
Thin Film Deposition
33%