Three-dimensional integration of two-dimensional field-effect transistors

  • Darsith Jayachandran
  • , Rahul Pendurthi
  • , Muhtasim Ul Karim Sadaf
  • , Najam U. Sakib
  • , Andrew Pannone
  • , Chen Chen
  • , Ying Han
  • , Nicholas Trainor
  • , Shalini Kumari
  • , Thomas V. Mc Knight
  • , Joan M. Redwing
  • , Yang Yang
  • , Saptarshi Das

Research output: Contribution to journalArticlepeer-review

Abstract

In the field of semiconductors, three-dimensional (3D) integration not only enables packaging of more devices per unit area, referred to as ‘More Moore’ 1 but also introduces multifunctionalities for ‘More than Moore’ 2 technologies. Although silicon-based 3D integrated circuits are commercially available 3–5, there is limited effort on 3D integration of emerging nanomaterials 6,7 such as two-dimensional (2D) materials despite their unique functionalities 7–10. Here we demonstrate (1) wafer-scale and monolithic two-tier 3D integration based on MoS2 with more than 10,000 field-effect transistors (FETs) in each tier; (2) three-tier 3D integration based on both MoS2 and WSe2 with about 500 FETs in each tier; and (3) two-tier 3D integration based on 200 scaled MoS2 FETs (channel length, L CH = 45 nm) in each tier. We also realize a 3D circuit and demonstrate multifunctional capabilities, including sensing and storage. We believe that our demonstrations will serve as the foundation for more sophisticated, highly dense and functionally divergent integrated circuits with a larger number of tiers integrated monolithically in the third dimension.

Original languageEnglish (US)
Pages (from-to)276-281
Number of pages6
JournalNature
Volume625
Issue number7994
DOIs
StatePublished - Jan 11 2024

All Science Journal Classification (ASJC) codes

  • General

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