Threshold voltage instability in a-Si:H TFTs and the implications for flexible displays and circuits

D. R. Allee; S. M. Venugopal; R. Shringarpure; K. Kaftanoglu; S. G. Uppili; L. T. Clark; Bryan Vogt; E. J. Bawolek

Threshold voltage instability in a-Si:H TFTs and the implications for flexible displays and circuits

D. R. Allee, S. M. Venugopal, R. Shringarpure, K. Kaftanoglu, S. G. Uppili, L. T. Clark, Bryan Vogt, E. J. Bawolek

Chemical Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

Electrical stress degradation of low temperature, amorphous silicon thin film transistors is reviewed, and the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented.

Original language	English (US)
Pages (from-to)	1297-1300
Number of pages	4
Journal	Proceedings of International Meeting on Information Display
Volume	8
State	Published - Dec 1 2008
Event	8th International Meeting on Information Display - International Display Manufacturing Conference 2008 and Asia Display 2008, IMID/IDMC/ASIA DISPLAY 2008 - Ilsan, Korea, Republic of Duration: Oct 13 2008 → Oct 17 2008

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

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title = "Threshold voltage instability in a-Si:H TFTs and the implications for flexible displays and circuits",

abstract = "Electrical stress degradation of low temperature, amorphous silicon thin film transistors is reviewed, and the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented.",

author = "Allee, {D. R.} and Venugopal, {S. M.} and R. Shringarpure and K. Kaftanoglu and Uppili, {S. G.} and Clark, {L. T.} and Bryan Vogt and Bawolek, {E. J.}",

year = "2008",

month = dec,

day = "1",

language = "English (US)",

volume = "8",

pages = "1297--1300",

journal = "Proceedings of International Meeting on Information Display",

issn = "1738-7558",

note = "8th International Meeting on Information Display - International Display Manufacturing Conference 2008 and Asia Display 2008, IMID/IDMC/ASIA DISPLAY 2008 ; Conference date: 13-10-2008 Through 17-10-2008",

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TY - JOUR

T1 - Threshold voltage instability in a-Si:H TFTs and the implications for flexible displays and circuits

AU - Allee, D. R.

AU - Venugopal, S. M.

AU - Shringarpure, R.

AU - Kaftanoglu, K.

AU - Uppili, S. G.

AU - Clark, L. T.

AU - Vogt, Bryan

AU - Bawolek, E. J.

PY - 2008/12/1

Y1 - 2008/12/1

N2 - Electrical stress degradation of low temperature, amorphous silicon thin film transistors is reviewed, and the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented.

AB - Electrical stress degradation of low temperature, amorphous silicon thin film transistors is reviewed, and the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented.

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UR - http://www.scopus.com/inward/citedby.url?scp=65649136194&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:65649136194

SN - 1738-7558

VL - 8

SP - 1297

EP - 1300

JO - Proceedings of International Meeting on Information Display

JF - Proceedings of International Meeting on Information Display

T2 - 8th International Meeting on Information Display - International Display Manufacturing Conference 2008 and Asia Display 2008, IMID/IDMC/ASIA DISPLAY 2008

Y2 - 13 October 2008 through 17 October 2008

ER -

Threshold voltage instability in a-Si:H TFTs and the implications for flexible displays and circuits

Abstract

All Science Journal Classification (ASJC) codes

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