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Time-resolved photocurrent spectroscopic diagnostics of electrically active defects in AlGaN/GaN High Electron Mobility Transistor (HEMT) structure grown on Si wafers

  • Burcu Ozden
  • , Min P. Khanal
  • , Vahid Mirkhani
  • , Kosala Yapabandara
  • , Chungman Yang
  • , Sangjong Ko
  • , Suhyeon Youn
  • , Michael C. Hamilton
  • , Mobbassar Hassan Sk
  • , Ayayi Claude Ahyi
  • , Minseo Park

Research output: Contribution to journal › Article › peer-review

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