Skip to main navigation Skip to search Skip to main content

TiN and ZrN based ohmic contacts to n-GaN

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Metal electrical contacts that exhibit good thermal stability and desirable electrical characteristics are required for the development of high temperature devices based on the III-V nitrides. To make improvements on existing contacts or to develop new ones, information on the metallurgy of these contacts is needed. In this work, selected early transition metal-based ohmic contacts to n-GaN are examined from both a high-temperature materials chemistry and electrical standpoint.

Original languageEnglish (US)
Title of host publication1998 4th International High Temperature Electronics Conference, HITEC 1998
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages134-137
Number of pages4
ISBN (Print)0780345401, 9780780345409
DOIs
StatePublished - 1998
Event1998 4th International High Temperature Electronics Conference, HITEC 1998 - Allbuquerque, United States
Duration: Jun 14 1998Jun 18 1998

Publication series

Name1998 4th International High Temperature Electronics Conference, HITEC 1998

Other

Other1998 4th International High Temperature Electronics Conference, HITEC 1998
Country/TerritoryUnited States
CityAllbuquerque
Period6/14/986/18/98

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials

Fingerprint

Dive into the research topics of 'TiN and ZrN based ohmic contacts to n-GaN'. Together they form a unique fingerprint.

Cite this