TY - GEN
T1 - TOIC
T2 - 29th Great Lakes Symposium on VLSI, GLSVLSI 2019
AU - Alam, Mahabubul
AU - Ghosh, Swaroop
AU - Hosur, Sujay S.
N1 - Funding Information:
This work is supported by SRC (2847.001), NSF (CNS-1722557, CCF-1718474, DGE-1723687 and DGE-1821766) and DARPA Young Faculty Award (D15AP00089).
Publisher Copyright:
© 2019 ACM.
PY - 2019/5/13
Y1 - 2019/5/13
N2 - To counter the threats of reverse engineering (RE) and Trojan in-sertion, researchers have considered gate-level obfuscation in inte-grated circuits (IC) as a viable solution. However, several techniques are present in the literature to crack the obfuscation with varying degree of success raising the concern about their secrecy. In this article, we have presented TOIC (Timing Obfuscated Integrated Circuits), a novel technique where sequential elements are obfuscated to hide the true timing paths in the design. TOIC can act as a standalone countermeasure against IC reverse engineering or can be incorporated with existing gate camouflaging techniques to maximize adversarial RE effort. Previous research has shown that limiting access to internal nodes can improve the adversarial RE effort at the cost of poor testability. TOIC can impose prohibitively large decamouflaging time complexity by limiting the controllability and observability over the internal nodes in an IC while preserving complete testability.
AB - To counter the threats of reverse engineering (RE) and Trojan in-sertion, researchers have considered gate-level obfuscation in inte-grated circuits (IC) as a viable solution. However, several techniques are present in the literature to crack the obfuscation with varying degree of success raising the concern about their secrecy. In this article, we have presented TOIC (Timing Obfuscated Integrated Circuits), a novel technique where sequential elements are obfuscated to hide the true timing paths in the design. TOIC can act as a standalone countermeasure against IC reverse engineering or can be incorporated with existing gate camouflaging techniques to maximize adversarial RE effort. Previous research has shown that limiting access to internal nodes can improve the adversarial RE effort at the cost of poor testability. TOIC can impose prohibitively large decamouflaging time complexity by limiting the controllability and observability over the internal nodes in an IC while preserving complete testability.
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U2 - 10.1145/3299874.3318001
DO - 10.1145/3299874.3318001
M3 - Conference contribution
AN - SCOPUS:85075016208
T3 - Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI
SP - 105
EP - 110
BT - GLSVLSI 2019 - Proceedings of the 2019 Great Lakes Symposium on VLSI
PB - Association for Computing Machinery
Y2 - 9 May 2019 through 11 May 2019
ER -