Tolerating write disturbance errors in pcm: Experimental characterization, analysis, and mechanisms

Keyphrases

• Experimental Mechanism 100%
• Character Analysis 100%
• Experimental Characterization 100%
• Perturbation Error 100%
• Main Memory 80%
• Phase Change Random Access Memory (PCRAM) 80%
• Computing Systems 40%
• Bitline 40%
• Memory-based 40%
• Write Operation 40%
• Wordline 40%
• Downscaling 20%
• System Performance 20%
• Thermal Disturbance 20%
• Cell Size 20%
• Non-overlapping 20%
• Reliability Issues 20%
• Data Compression 20%
• Power Consumption 20%
• Memory Architecture 20%
• Access Latency 20%
• Performance Loss 20%
• Dense Phase 20%
• Low Overhead 20%
• Technology Scaling 20%
• Memory Subsystem 20%
• Heat-induced 20%
• Modern Computing 20%
• Size Scaling 20%
• Adjacent Cell 20%
• Submicron Scale 20%
• Promising Technology 20%
• High Scalability 20%
• Thread-level Parallelism 20%
• Dominant Technology 20%
• Future Computing 20%
• Differential Write 20%
• Subsetting 20%

Computer Science

• Step Verification 25%