Abstract
The coupled dipole method (CDM) and the method of moments (MOM) can both be applied to study the light scattering responses of microstructures commnly found in optical and infrared thin films. A comparative analysis of the MOM and the CDM for these scattering problems is done. Three estimates of the polarizability scalars of subregional volumes are also compared.
Original language | English (US) |
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Pages (from-to) | 869-886 |
Number of pages | 18 |
Journal | International Journal of Infrared and Millimeter Waves |
Volume | 13 |
Issue number | 6 |
DOIs | |
State | Published - Jun 1992 |
All Science Journal Classification (ASJC) codes
- Radiation
- Atomic and Molecular Physics, and Optics
- Instrumentation
- Condensed Matter Physics
- Physics and Astronomy (miscellaneous)
- Electrical and Electronic Engineering