Toward classifying elementary microstructures in thin films by their scattering responses

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Pages (from-to)	663
Number of pages	1
Journal	International Journal of Infrared and Millimeter Waves
Volume	14
Issue number	3
DOIs	https://doi.org/10.1007/BF02209272
State	Published - Mar 1993

All Science Journal Classification (ASJC) codes

@article{4ac60531c5ad41dda7de0c78d04958cd,

title = "Toward classifying elementary microstructures in thin films by their scattering responses",

author = "Akhlesh Lakhtakia",

year = "1993",

month = mar,

doi = "10.1007/BF02209272",

language = "English (US)",

volume = "14",

pages = "663",

journal = "International Journal of Infrared and Millimeter Waves",

issn = "0195-9271",

publisher = "Springer New York",

number = "3",

}

TY - JOUR

T1 - Toward classifying elementary microstructures in thin films by their scattering responses

AU - Lakhtakia, Akhlesh

PY - 1993/3

Y1 - 1993/3

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U2 - 10.1007/BF02209272

DO - 10.1007/BF02209272

M3 - Comment/debate

AN - SCOPUS:34250076388

SN - 0195-9271

VL - 14

SP - 663

JO - International Journal of Infrared and Millimeter Waves

JF - International Journal of Infrared and Millimeter Waves

IS - 3

ER -