TY - GEN
T1 - Transient based relay testing
T2 - 2006 IEEE Mediterranean Electrotechnical Conference, MELECON 2006
AU - Nan, Zhang
AU - Song, Hongbiao
AU - Kezunovic, Mladen
PY - 2006
Y1 - 2006
N2 - This paper provides an overview of the scope and methodology for transient relay testing. The scope of transient relay testing is divided into: a) conformance test for examining the functionality and generic performance characteristics of relays, and b) application test for analyzing the specific performance issues and trouble-shooting relay misoperations. For conformance test, the methodology including system modeling, automated generation of test scenarios, relay modeling, and implementation of automated relay testing is discussed in detail. For application test, the key issue is the selection of typical scenarios for analyzing the relay behavior in vulnerable system conditions. A view about benefits and approaches of transient based relay testing is explained in this paper.
AB - This paper provides an overview of the scope and methodology for transient relay testing. The scope of transient relay testing is divided into: a) conformance test for examining the functionality and generic performance characteristics of relays, and b) application test for analyzing the specific performance issues and trouble-shooting relay misoperations. For conformance test, the methodology including system modeling, automated generation of test scenarios, relay modeling, and implementation of automated relay testing is discussed in detail. For application test, the key issue is the selection of typical scenarios for analyzing the relay behavior in vulnerable system conditions. A view about benefits and approaches of transient based relay testing is explained in this paper.
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M3 - Conference contribution
AN - SCOPUS:34047157275
SN - 1424400872
SN - 9781424400874
T3 - Proceedings of the Mediterranean Electrotechnical Conference - MELECON
SP - 1110
EP - 1113
BT - 2006 IEEE Mediterranean Electrotechnical Conference, MELECON 2006 - Circuits and Systems for Signal Processing, lnformation and Communication Technologies, and Power Sources and Systems
Y2 - 16 May 2006 through 19 May 2006
ER -