Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure

J. S. Luo; S. E. Dorris; M. T. Lanagan; V. A. Maroni

Transmission electron microscopy of Pb-doped Bi₂Sr₂Ca₂Cu₃O_x/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure

J. S. Luo
, S. E. Dorris
, M. T. Lanagan
, V. A. Maroni

Research output: Contribution to conference › Paper › peer-review

Abstract

Transmission electron microscopy and energy dispersive X-ray spectroscopy were utilized to investigate the composition and microstructure of Pb-doped (Bi-2223)/Ag composite conductors. The observed differences are discussed with respect to the measured electric properties. Detailed TEM observations revealed a brick-wall microstructure, which is also characteristic of high quality powder-in-tube processed Bi-based superconductors. However, the specimen prepared from the precursor having the smallest y value (y = 0 and 0.4 moles of Ca₂PbO₄) contained a large number of Bi-2223 grains with small aspect ratio. The presence of these grains probably caused the formation of weakly coupled grain boundaries and hence lower critical current densities.

Original language	English (US)
Pages	798-799
Number of pages	2
State	Published - 1994
Event	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994

Other

Other	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America
City	New Orleans, LA, USA
Period	7/31/94 → 8/5/94

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

Luo, J. S., Dorris, S. E., Lanagan, M. T., & Maroni, V. A. (1994). Transmission electron microscopy of Pb-doped Bi₂Sr₂Ca₂Cu₃O_x/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure. 798-799. Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA.

@conference{3683718fe84e41e9b5566378b14e25fd,

title = "Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure",

abstract = "Transmission electron microscopy and energy dispersive X-ray spectroscopy were utilized to investigate the composition and microstructure of Pb-doped (Bi-2223)/Ag composite conductors. The observed differences are discussed with respect to the measured electric properties. Detailed TEM observations revealed a brick-wall microstructure, which is also characteristic of high quality powder-in-tube processed Bi-based superconductors. However, the specimen prepared from the precursor having the smallest y value (y = 0 and 0.4 moles of Ca2PbO4) contained a large number of Bi-2223 grains with small aspect ratio. The presence of these grains probably caused the formation of weakly coupled grain boundaries and hence lower critical current densities.",

author = "Luo, \{J. S.\} and Dorris, \{S. E.\} and Lanagan, \{M. T.\} and Maroni, \{V. A.\}",

year = "1994",

language = "English (US)",

pages = "798--799",

note = "Proceedings of the 52nd Annual Meeting of the Microscopy Society of America ; Conference date: 31-07-1994 Through 05-08-1994",

}

Luo, JS, Dorris, SE, Lanagan, MT & Maroni, VA 1994, 'Transmission electron microscopy of Pb-doped Bi₂Sr₂Ca₂Cu₃O_x/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure', Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, 7/31/94 - 8/5/94 pp. 798-799.

Transmission electron microscopy of Pb-doped Bi₂Sr₂Ca₂Cu₃O_x/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure. / Luo, J. S.; Dorris, S. E.; Lanagan, M. T. et al.
1994. 798-799 Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Transmission electron microscopy of Pb-doped Bi2Sr2Ca2Cu3Ox/Ag composite conductors prepared by the two-powder process

T2 - Proceedings of the 52nd Annual Meeting of the Microscopy Society of America

AU - Luo, J. S.

AU - Dorris, S. E.

AU - Lanagan, M. T.

AU - Maroni, V. A.

PY - 1994

Y1 - 1994

N2 - Transmission electron microscopy and energy dispersive X-ray spectroscopy were utilized to investigate the composition and microstructure of Pb-doped (Bi-2223)/Ag composite conductors. The observed differences are discussed with respect to the measured electric properties. Detailed TEM observations revealed a brick-wall microstructure, which is also characteristic of high quality powder-in-tube processed Bi-based superconductors. However, the specimen prepared from the precursor having the smallest y value (y = 0 and 0.4 moles of Ca2PbO4) contained a large number of Bi-2223 grains with small aspect ratio. The presence of these grains probably caused the formation of weakly coupled grain boundaries and hence lower critical current densities.

AB - Transmission electron microscopy and energy dispersive X-ray spectroscopy were utilized to investigate the composition and microstructure of Pb-doped (Bi-2223)/Ag composite conductors. The observed differences are discussed with respect to the measured electric properties. Detailed TEM observations revealed a brick-wall microstructure, which is also characteristic of high quality powder-in-tube processed Bi-based superconductors. However, the specimen prepared from the precursor having the smallest y value (y = 0 and 0.4 moles of Ca2PbO4) contained a large number of Bi-2223 grains with small aspect ratio. The presence of these grains probably caused the formation of weakly coupled grain boundaries and hence lower critical current densities.

UR - https://www.scopus.com/pages/publications/0028737227

UR - https://www.scopus.com/pages/publications/0028737227#tab=citedBy

M3 - Paper

AN - SCOPUS:0028737227

SP - 798

EP - 799

Y2 - 31 July 1994 through 5 August 1994

ER -

Transmission electron microscopy of Pb-doped Bi₂Sr₂Ca₂Cu₃O_x/Ag composite conductors prepared by the two-powder process: The effect of lead addition on critical current and microstructure

Abstract

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