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Trap-related parametric shifts under DC bias and switched operation life stress in power AlGaN/GaN HEMTs
S. G. Khalil, L. Ray, M. Chen, R. Chu, D. Zehnder, A. Garrido, M. Munsi, S. Kim, B. Hughes, K. Boutros, R. J. Kaplar, J. Dickerson, S. Dasgupta, S. Atcitty, M. J. Marinella
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2
Scopus
citations