Trap-related parametric shifts under DC bias and switched operation life stress in power AlGaN/GaN HEMTs

S. G. Khalil, L. Ray, M. Chen, R. Chu, D. Zehnder, A. Garrido, M. Munsi, S. Kim, B. Hughes, K. Boutros, R. J. Kaplar, J. Dickerson, S. Dasgupta, S. Atcitty, M. J. Marinella

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

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Engineering & Materials Science