TY - GEN
T1 - TroScan
T2 - 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024
AU - Wang, Jianfeng
AU - Deng, Shuwen
AU - Yang, Huazhong
AU - Narayanan, Vijaykrishnan
AU - Li, Xueqing
N1 - Publisher Copyright:
© 2024 EDAA.
PY - 2024
Y1 - 2024
N2 - Keys grant access to devices and are the core secrets in logic obfuscation. Typically, keys are stored in tamper-proof memory and are subsequently delivered to logic locking modules through scan chains. However, recent physical attacks have successfully extracted keys directly from registers, challenging the security of the prior scan obfuscation/blocking efforts. This paper mitigates the threat of direct value extraction by proposing TroScan, an architecture that leverages the internal frequency of register chains to activate trigger circuits. We propose three key generation methods for typical defense scenarios and gate-aware obfuscation optimization. To the authors' best knowledge, this work presents the first on-chip key delivery obfuscation architecture against Electro-Optical Frequency Mapping (EOFM) attacks. Evaluation shows 100% key obfuscation effectiveness under two EOFM attack targets. For overheads, we demonstrate the worst-case fault coverage rate of 97.6%, average area/power overheads of 7.5%/11.8%, and an average key generation success rate of 98% across 80 process voltage temperature (PVT) conditions.
AB - Keys grant access to devices and are the core secrets in logic obfuscation. Typically, keys are stored in tamper-proof memory and are subsequently delivered to logic locking modules through scan chains. However, recent physical attacks have successfully extracted keys directly from registers, challenging the security of the prior scan obfuscation/blocking efforts. This paper mitigates the threat of direct value extraction by proposing TroScan, an architecture that leverages the internal frequency of register chains to activate trigger circuits. We propose three key generation methods for typical defense scenarios and gate-aware obfuscation optimization. To the authors' best knowledge, this work presents the first on-chip key delivery obfuscation architecture against Electro-Optical Frequency Mapping (EOFM) attacks. Evaluation shows 100% key obfuscation effectiveness under two EOFM attack targets. For overheads, we demonstrate the worst-case fault coverage rate of 97.6%, average area/power overheads of 7.5%/11.8%, and an average key generation success rate of 98% across 80 process voltage temperature (PVT) conditions.
UR - http://www.scopus.com/inward/record.url?scp=85196483715&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85196483715&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:85196483715
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 March 2024 through 27 March 2024
ER -