Abstract
The total-reflection phenomenon is shown to restrict the angular spread of the Bragg phenomenon, when a plane wave is incident on a chiral sculptured thin film (STF) from an optically denser medium. Unlike the Bragg phenomenon, the total-reflection phenomenon is insensitive to the structural handedness of the chiral STF. Mechanically tunable Goos-Hänchen shifts that are appreciable fractions of the wavelength are experienced by beams of finite transverse extent, in the total-reflection regime.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 169-176 |
| Number of pages | 8 |
| Journal | AEU-Archiv fur Elektronik und Ubertragungstechnik |
| Volume | 56 |
| Issue number | 3 |
| DOIs | |
| State | Published - 2002 |
All Science Journal Classification (ASJC) codes
- Computer Networks and Communications
- Electrical and Electronic Engineering