Ultrasonic C-scan imaging for material characterization

Advances in the field have enabled ultrasonic C-scan imaging to go beyond its classical application of detecting large single flaws to meet the challenge of non-destructive evaluation for modern engineered structures and new materials. Increased frequency of operation and novel transducer designs have led to micrometre resolution limits for both surface and subsurface imaging. Improved image processing analysis methods allow more information to be extracted from the classical and contemporary application of the C-scan technique. Important results and developments are discussed with references made to industrial applications.