Ultrasonic feature based imaging for post factum control

This work focuses on the ultrasonic feature-mapping technique for post-factum control. Feature-based analysis and material state imaging constitute a powerful technique, applying both physically and statistically based principles. The technique integrates many data collection procedures, such as critical angles, surface waves, plate waves, and backscattering techniques, into an extremely versatile data acquisition protocol and entails detailed analysis through state-of-the-technology signal processing, pattern recognition, and system and/or artificial intelligence implementation practice. The various existing possibilities for physically based data collection and the types of feature domains and features available for anomaly representation in materials are discussed. Possible applications of feature-based imaging in a manufacturing environment through post-factum quality control are considered.