Abstract
The interface position of a CaF2 crystal was successfully monitored during growth using an innovative ultrasonic sensor system. The sensor system utilizes a top entry approach consisting of probe rods permanently positioned at the bottom of the crucible. Ultrasonic time of flight data (TOF) is used to determine interface position.
Original language | English (US) |
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Pages (from-to) | 761-764 |
Number of pages | 4 |
Journal | Crystal Research and Technology |
Volume | 40 |
Issue number | 8 |
DOIs | |
State | Published - Aug 2005 |
All Science Journal Classification (ASJC) codes
- General Chemistry
- General Materials Science
- Condensed Matter Physics