Abstract
The interface position of a CaF2 crystal was successfully monitored during growth using an innovative ultrasonic sensor system. The sensor system utilizes a top entry approach consisting of probe rods permanently positioned at the bottom of the crucible. Ultrasonic time of flight data (TOF) is used to determine interface position.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 761-764 |
| Number of pages | 4 |
| Journal | Crystal Research and Technology |
| Volume | 40 |
| Issue number | 8 |
| DOIs | |
| State | Published - Aug 2005 |
All Science Journal Classification (ASJC) codes
- General Chemistry
- General Materials Science
- Condensed Matter Physics
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