TY - JOUR
T1 - Ultraviolet-assisted cold poling of Pb(Zr0.52Ti0.48)O3 films
AU - Zhu, Wanlin
AU - Luo, Wei
AU - Akkopru-Akgun, Betul
AU - Lanagan, Michael
AU - Randall, Clive A.
AU - Trolier-McKinstry, Susan
N1 - Funding Information:
The authors would like to acknowledge financial support from Aninitech Corp. Ltd. The authors are grateful to Adarsh Rajashekhar, Bill Genet, and Rob
Publisher Copyright:
© 2018, Springer Science+Business Media, LLC, part of Springer Nature.
PY - 2018/5/1
Y1 - 2018/5/1
N2 - This paper discusses the advantages of a room-temperature poling procedure during exposure to ultraviolet light for Pb(Zr0.52Ti0.48)O3 (PZT) films. The results of these experiments include the following: for 1.7-µm-thick chemical solution-deposited PZT films, the saturation photocurrent density after a 10 min white light exposure (190–1900 nm) (no DC bias field applied) increased up to 0.066 µA/cm2 with increasing Cr thickness of top electrode in Cr/Pt bilayer electrodes. Furthermore, the d33,f piezoelectric coefficients for UV-poled samples were 40 and 20% higher than those achieved from field-only poling at either room temperature or 150 °C. Additionally, the development of an internal bias field and pinching were investigated in major and minor polarization–electric field loops. It was found that ultraviolet illumination during the poling process produced photoinduced charge carriers that became trapped by local defects and/or grain boundaries in the films.
AB - This paper discusses the advantages of a room-temperature poling procedure during exposure to ultraviolet light for Pb(Zr0.52Ti0.48)O3 (PZT) films. The results of these experiments include the following: for 1.7-µm-thick chemical solution-deposited PZT films, the saturation photocurrent density after a 10 min white light exposure (190–1900 nm) (no DC bias field applied) increased up to 0.066 µA/cm2 with increasing Cr thickness of top electrode in Cr/Pt bilayer electrodes. Furthermore, the d33,f piezoelectric coefficients for UV-poled samples were 40 and 20% higher than those achieved from field-only poling at either room temperature or 150 °C. Additionally, the development of an internal bias field and pinching were investigated in major and minor polarization–electric field loops. It was found that ultraviolet illumination during the poling process produced photoinduced charge carriers that became trapped by local defects and/or grain boundaries in the films.
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U2 - 10.1007/s10853-018-2069-y
DO - 10.1007/s10853-018-2069-y
M3 - Article
AN - SCOPUS:85041598871
SN - 0022-2461
VL - 53
SP - 7180
EP - 7186
JO - Journal of Materials Science
JF - Journal of Materials Science
IS - 10
ER -