TY - GEN
T1 - Underwater mine classification with imperfect labels
AU - Williams, David P.
PY - 2010
Y1 - 2010
N2 - A new algorithm for performing classification with imperfectly labeled data is presented. The proposed approach is motivated by the insight that the average prediction of a group of sufficiently informed people is often more accurate than the prediction of any one supposed expert. This idea that the "wisdom of crowds" can outperform a single expert is implemented by drawing sets of labels as samples from a Bernoulli distribution with a specified labeling error rate. Additionally, ideas from multiple imputation are exploited to provide a principled way for determining an appropriate number of label sampling rounds to consider. The approach is demonstrated in the context of an underwater mine classification application on real synthetic aperture sonar data collected at sea, with promising results.
AB - A new algorithm for performing classification with imperfectly labeled data is presented. The proposed approach is motivated by the insight that the average prediction of a group of sufficiently informed people is often more accurate than the prediction of any one supposed expert. This idea that the "wisdom of crowds" can outperform a single expert is implemented by drawing sets of labels as samples from a Bernoulli distribution with a specified labeling error rate. Additionally, ideas from multiple imputation are exploited to provide a principled way for determining an appropriate number of label sampling rounds to consider. The approach is demonstrated in the context of an underwater mine classification application on real synthetic aperture sonar data collected at sea, with promising results.
UR - http://www.scopus.com/inward/record.url?scp=78149484771&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78149484771&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2010.1011
DO - 10.1109/ICPR.2010.1011
M3 - Conference contribution
AN - SCOPUS:78149484771
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 4157
EP - 4161
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
T2 - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Y2 - 23 August 2010 through 26 August 2010
ER -