TY - JOUR
T1 - Using deep image colorization to predict microstructure-dependent strain fields
AU - Khanolkar, Pranav Milind
AU - Abraham, Aaron
AU - McComb, Christopher
AU - Basu, Saurabh
N1 - Publisher Copyright:
© 2020 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
PY - 2020
Y1 - 2020
N2 - The microstructure of a material governs mechanical properties such as strength and toughness. Various finite element analysis (FEA) software packages are used to perform structural analyses such as predicting the flow of strain or strain fields in a microstructure. Engineers frequently operate these software packages to evaluate mechanical behavior and predict failure. Even though these FEA software packages provide highly accurate analyses, they are computationally intensive, taking a significant amount of time to produce a solution. The time required by the FEA software packages to achieve accurate results largely depends on microstructure details and mesh resolution, thus providing a trade-off between fidelity and computation time. This research proposes the use of Deep Learning algorithms to achieve a significant reduction in the time required to predict high-accuracy strain fields in a two-dimensional microstructure with defects. This work presents a foundation for developing deep neural networks to conduct structural analyses, thus reducing the exclusive use of computationally demanding FEA software and augmenting the analytical capabilities of scientists and engineers.
AB - The microstructure of a material governs mechanical properties such as strength and toughness. Various finite element analysis (FEA) software packages are used to perform structural analyses such as predicting the flow of strain or strain fields in a microstructure. Engineers frequently operate these software packages to evaluate mechanical behavior and predict failure. Even though these FEA software packages provide highly accurate analyses, they are computationally intensive, taking a significant amount of time to produce a solution. The time required by the FEA software packages to achieve accurate results largely depends on microstructure details and mesh resolution, thus providing a trade-off between fidelity and computation time. This research proposes the use of Deep Learning algorithms to achieve a significant reduction in the time required to predict high-accuracy strain fields in a two-dimensional microstructure with defects. This work presents a foundation for developing deep neural networks to conduct structural analyses, thus reducing the exclusive use of computationally demanding FEA software and augmenting the analytical capabilities of scientists and engineers.
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U2 - 10.1016/j.promfg.2020.05.138
DO - 10.1016/j.promfg.2020.05.138
M3 - Conference article
AN - SCOPUS:85095134762
SN - 2351-9789
VL - 48
SP - 992
EP - 999
JO - 48th SME North American Manufacturing Research Conference, NAMRC 48
JF - 48th SME North American Manufacturing Research Conference, NAMRC 48
T2 - 48th SME North American Manufacturing Research Conference, NAMRC 48
Y2 - 22 June 2020 through 26 June 2020
ER -