Using loop invariants to fight soft errors in data caches

N. Sri Hari Krishna, Seung Woo Son, Mahmut Kandemir, Feihui Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Ever scaling process technology makes embedded systems more vulnerable to soft errors than in the past. One of the generic methods used to fight soft errors is based on duplicating instructions either in the spatial or temporal domain and then comparing the results to see whether they are different. This full duplication based scheme, though effective, is very expensive in terms of performance, power, and memory space. In this paper, we propose an alternate scheme based on loop invariants and present experimental results which show that our approach catches 62% of the errors caught by full duplication, when averaged over all benchmarks tested. In addition, it reduces the execution cycles and memory demand of the full duplication strategy by 80% and 4%, respectively.

Original languageEnglish (US)
Title of host publicationProceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
Pages1317-1320
Number of pages4
StatePublished - Dec 1 2005
Event2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 - Shanghai, China
Duration: Jan 18 2005Jan 21 2005

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume2

Other

Other2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
Country/TerritoryChina
CityShanghai
Period1/18/051/21/05

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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