Variable magnetic field and temperature magnetic force microscopy

J. Mohanty; R. Engel-Herbert; T. Hesjedal

doi:10.1007/s00339-005-3277-2

Variable magnetic field and temperature magnetic force microscopy

J. Mohanty, R. Engel-Herbert, T. Hesjedal

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

Magnetic force microscopy (MFM) studies of epitaxial MnAs films on GaAs(001) have been performed as a function of the applied magnetic field and the sample temperature. For this purpose, we combined a stable variable-temperature sample stage with a compact magnet assembly to fit a commercial magnetic force microscope. In order to keep the thermal drift that affects MFM measurements low, we employed a permanent magnet that can be rotated in a yoke assembly guiding the magnetic flux to the sample.

Original language	English (US)
Pages (from-to)	1359-1362
Number of pages	4
Journal	Applied Physics A: Materials Science and Processing
Volume	81
Issue number	7
DOIs	https://doi.org/10.1007/s00339-005-3277-2
State	Published - Nov 2005

All Science Journal Classification (ASJC) codes

General Chemistry
General Materials Science

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abstract = "Magnetic force microscopy (MFM) studies of epitaxial MnAs films on GaAs(001) have been performed as a function of the applied magnetic field and the sample temperature. For this purpose, we combined a stable variable-temperature sample stage with a compact magnet assembly to fit a commercial magnetic force microscope. In order to keep the thermal drift that affects MFM measurements low, we employed a permanent magnet that can be rotated in a yoke assembly guiding the magnetic flux to the sample.",

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AB - Magnetic force microscopy (MFM) studies of epitaxial MnAs films on GaAs(001) have been performed as a function of the applied magnetic field and the sample temperature. For this purpose, we combined a stable variable-temperature sample stage with a compact magnet assembly to fit a commercial magnetic force microscope. In order to keep the thermal drift that affects MFM measurements low, we employed a permanent magnet that can be rotated in a yoke assembly guiding the magnetic flux to the sample.

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Variable magnetic field and temperature magnetic force microscopy

Abstract

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