TY - GEN
T1 - Variation impact on ser of combinational circuits
AU - Ramakrishnan, K.
AU - Rajaraman, R.
AU - Suresh, S.
AU - Vijaykrishnan, N.
AU - Xie, Y.
AU - Irwin, M. J.
PY - 2007
Y1 - 2007
N2 - Increasing variability not only affects the behavior of contemporary ICs but also their vulnerability to transient error phenomenon especially radiation induced soft errors. Such variations in device parameters are caused by static process variations, dynamic variations in power supply and temperature and slow degradation of individual devices due to phenomena like Hot Carrier Injection (HCI) and Negative Bias Temperature Instability (NBTI). In this paper , we analyze the impact of such variations on the Soft Error Rates (SER) of combinational logic circuits. Other contributions of this work also include tools that model threshold degradation of NMOS due to HCI and PMOS due to NBTI in logic circuits. Results were obtained for custom designed circuits and ISCAS-85 benchmarks. A detailed analysis of effect of threshold variations on SER is also presented with interesting observations.
AB - Increasing variability not only affects the behavior of contemporary ICs but also their vulnerability to transient error phenomenon especially radiation induced soft errors. Such variations in device parameters are caused by static process variations, dynamic variations in power supply and temperature and slow degradation of individual devices due to phenomena like Hot Carrier Injection (HCI) and Negative Bias Temperature Instability (NBTI). In this paper , we analyze the impact of such variations on the Soft Error Rates (SER) of combinational logic circuits. Other contributions of this work also include tools that model threshold degradation of NMOS due to HCI and PMOS due to NBTI in logic circuits. Results were obtained for custom designed circuits and ISCAS-85 benchmarks. A detailed analysis of effect of threshold variations on SER is also presented with interesting observations.
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U2 - 10.1109/ISQED.2007.168
DO - 10.1109/ISQED.2007.168
M3 - Conference contribution
AN - SCOPUS:34548120787
SN - 0769527957
SN - 9780769527956
T3 - Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
SP - 911
EP - 916
BT - Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
T2 - 8th International Symposium on Quality Electronic Design, ISQED 2007
Y2 - 26 March 2007 through 28 March 2007
ER -