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Vertical 2T-nC FeRAM Demonstration: BEOL Read Transistor for 4F2 Memory Strings and Two-Terminal Selector Design for Polarization Disturb Mitigation

  • Shan Deng
  • , John Howe
  • , Sizhe Ma
  • , Sadik Yasir Tauki
  • , Zijian Zhao
  • , Jiahui Duan
  • , Yu Shan Lee
  • , Yixin Qin
  • , Rajiv Joshi
  • , Thomas Kampfe
  • , Xiao Gong
  • , Vijaykrishnan Narayanan
  • , Kai Ni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work, we demonstrate a vertical 2T-nC FeRAM with a back-end-of-line (BEOL) read transistor (TR) for 4 F2 string and propose a selector design to mitigate polarization disturb in passive capacitor crossbar arrays. Key contributions include: 1) successful integration and operation composed of a Si MOSFET write transistor (TW), 3-layer cylindrical ferroelectric capacitors, and Si-doped In2O3 BEOL TR, demonstrating the feasibility of 4 F2 2 T-nC string; 2) introducing nonlinearity into the capacitor stack to suppress ferroelectric voltage drop under inhibition biases while maintaining sufficient write voltage, reducing disturbance; 3)modeling and experimental validation of inserting a metalsemiconductor (a-Si)-metal (MSM) selector into the capacitor in mitigating the disturb, particularly achieving 9x reduction of disturb after 106 cycles in the VW/ 2 scheme.

Original languageEnglish (US)
Title of host publication2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9784863488151
DOIs
StatePublished - 2025
Event2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025 - Kyoto, Japan
Duration: Jun 8 2025Jun 12 2025

Publication series

NameDigest of Technical Papers - Symposium on VLSI Technology
ISSN (Print)0743-1562
ISSN (Electronic)2158-9682

Conference

Conference2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025
Country/TerritoryJapan
CityKyoto
Period6/8/256/12/25

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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