Victor: A Variation-resilient Approach Using Cell-Clustered Charge-domain computing for High-density High-throughput MLC CiM

Keyphrases

• High-throughput 100%
• High Density 100%
• Multilevel Cell 100%
• In-memory 100%
• Charge Domain 100%
• Accuracy Loss 33%
• Design Methodology 16%
• Energy Efficiency 16%
• Throughput Performance 16%
• Recovery Unit 16%
• Non-ideality 16%
• Unit Design 16%
• Variation Tolerance 16%
• Reliability Performance 16%
• Non-volatility 16%
• CMOS Process 16%
• Energy Overhead 16%
• High Cell Density 16%
• Resistive Random Access Memory (ReRAM) 16%
• Matrix-vector multiplication 16%
• Accuracy Performance 16%
• Device-to-device Variation 16%
• Ratio-based 16%
• Accuracy Reliability 16%
• Dynamic Boundary 16%
• Latency Overhead 16%
• Computing Accuracy 16%

Computer Science

• High Throughput 100%
• Computing Domain 100%
• Energy Efficiency 50%
• Deep Neural Network 50%
• Vector Multiplication 50%
• Memory Design 50%
• Device-To-Device 50%

Engineering

• Multi-Level Cell 100%
• Limitations 16%
• Energy Conservation 16%
• Promising Candidate 16%
• Fits and Tolerances 16%
• Energy Efficiency 16%
• Resistive 16%
• Reliability Availability and Maintainability (Reliability Engineering) 16%