Abstract
Four examples of the application of atomistic modeling to the design and analysis of nanometer-scale device components and sensors are discussed. In the first two examples, semiempirical tight-binding electronic structure calculations are used to characterise the electronic properties of uniaxially-strained and chemically-decorated carbon nanotubules. The results are used to suggest possible designs for nanometer-scale strain gauges, vibration sensors, and Schottky diodes. In the second two examples, that are based on variations of scanning-probe microscopy, atomistic simulations are used to explore whether atomic-force microscopy can be used as a probe of surface stress distributions surrounding nanostructures, and whether chemically-reactive tips can be used to pattern surfaces.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 137-144 |
| Number of pages | 8 |
| Journal | JBIS - Journal of the British Interplanetary Society |
| Volume | 51 |
| Issue number | 4 |
| State | Published - 1998 |
All Science Journal Classification (ASJC) codes
- Aerospace Engineering
- Space and Planetary Science