Keyphrases
Atomic Force Microscopy
25%
Attenuation Coefficient
25%
Au Electrode
25%
Au Substrate
50%
Barrier Height
100%
Bias Voltage
25%
Conductive Atomic Force Microscopy (C-AFM)
25%
Current-voltage (I-V) Characteristics
25%
Direct Tunneling
25%
Electron Transport
100%
Energy Barrier
25%
Fermi Energy
50%
Highest Occupied Molecular Orbital
50%
I-V Curve
25%
Iron Porphyrin
100%
Microscopic Analysis
25%
Molecular Junctions
100%
Raman Spectroscopy
25%
Response Predictors
25%
Voltage Dependence
100%
Voltage Range
25%
Engineering
Atomic Force Microscopy
25%
Barrier Height
100%
Bias Voltage
25%
Conductive Atomic Force Microscopy
25%
Current-Voltage Characteristic
50%
Direct Tunneling
25%
Energy Barrier
25%
Fermi Energy
50%
Iron
100%
Earth and Planetary Sciences
Atomic Force Microscopy
66%
Attenuation Coefficient
33%
Iron
100%
Porphyrin
100%
Material Science
Atomic Force Microscopy
66%
Current-Voltage Characteristic
66%
Electron Transfer
100%
Microscopy
33%
Raman Spectroscopy
33%