TY - JOUR
T1 - Wall-to-wall stress induced in (6,5) semiconducting nanotubes by encapsulation in metallic outer tubes of different diameters
T2 - A resonance Raman study of individual C60-derived double-wall carbon nanotubes
AU - Villalpando-Paez, Federico
AU - Muramatsu, Hiroyuki
AU - Kim, Yoong Ahm
AU - Farhat, Hootan
AU - Endo, Morinobu
AU - Terrones, Mauricio
AU - Dresselhaus, Mildred S.
PY - 2010
Y1 - 2010
N2 - We measure resonant Raman scattering from 11 individual C 60-derived double-wall carbon nanotubes all having inner semiconducting (6,5) tubes and various outer metallic tubes. The Raman spectra show the radial breathing modes (RBM) of the inner and the outer tubes to be simultaneously in resonance with the same laser energy. We observe that an increase in the RBM frequency of the inner tubes is related to an increase in the RBM frequency of the outer tubes. The Raman spectra also contain a sharp G- feature that increases in frequency as the nominal diameter of the outer metallic tubes decreases. Finally, the one-phonon second-order D-band mode shows a two-way frequency splitting that decreases with decreasing nominal wall-to-wall distance. We suggest that the stress which increases with decreasing nominal wall-to-wall distance is responsible for the hardening that is observed in the frequencies of the RBM, D and G- modes of the inner (6,5) semiconducting tubes.
AB - We measure resonant Raman scattering from 11 individual C 60-derived double-wall carbon nanotubes all having inner semiconducting (6,5) tubes and various outer metallic tubes. The Raman spectra show the radial breathing modes (RBM) of the inner and the outer tubes to be simultaneously in resonance with the same laser energy. We observe that an increase in the RBM frequency of the inner tubes is related to an increase in the RBM frequency of the outer tubes. The Raman spectra also contain a sharp G- feature that increases in frequency as the nominal diameter of the outer metallic tubes decreases. Finally, the one-phonon second-order D-band mode shows a two-way frequency splitting that decreases with decreasing nominal wall-to-wall distance. We suggest that the stress which increases with decreasing nominal wall-to-wall distance is responsible for the hardening that is observed in the frequencies of the RBM, D and G- modes of the inner (6,5) semiconducting tubes.
UR - http://www.scopus.com/inward/record.url?scp=77953669828&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77953669828&partnerID=8YFLogxK
U2 - 10.1039/b9nr00268e
DO - 10.1039/b9nr00268e
M3 - Article
C2 - 20644824
AN - SCOPUS:77953669828
SN - 2040-3364
VL - 2
SP - 406
EP - 411
JO - Nanoscale
JF - Nanoscale
IS - 3
ER -