Welcome

Brian T. Cline; Steve Heinrich-Barna; Peter J. Wright; Hai Li; Vinod Viswanath; Shiyan Hu; Paul Wesling; Gang Qu; Swaroop Ghosh; Ali A. Iranmanesh

doi:10.1109/ISQED.2017.7918277

Welcome

Brian T. Cline
, Steve Heinrich-Barna
, Peter J. Wright
, Hai Li
, Vinod Viswanath
, Shiyan Hu
, Paul Wesling
, Gang Qu
, Swaroop Ghosh
, Ali A. Iranmanesh

Electrical Engineering

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Article number	7918277
Journal	Proceedings - International Symposium on Quality Electronic Design, ISQED
DOIs	https://doi.org/10.1109/ISQED.2017.7918277
State	Published - May 2 2017
Event	18th International Symposium on Quality Electronic Design, ISQED 2017 - Santa Clara, United States Duration: Mar 14 2017 → Mar 15 2017

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality

Access to Document

10.1109/ISQED.2017.7918277

Cite this

@article{0b59a0813a85455d9a100bcb3ae084b5,

title = "Welcome",

author = "Cline, \{Brian T.\} and Steve Heinrich-Barna and Wright, \{Peter J.\} and Hai Li and Vinod Viswanath and Shiyan Hu and Paul Wesling and Gang Qu and Swaroop Ghosh and Iranmanesh, \{Ali A.\}",

year = "2017",

month = may,

day = "2",

doi = "10.1109/ISQED.2017.7918277",

language = "English (US)",

journal = "Proceedings - International Symposium on Quality Electronic Design, ISQED",

issn = "1948-3287",

publisher = "IEEE Computer Society",

note = "18th International Symposium on Quality Electronic Design, ISQED 2017 ; Conference date: 14-03-2017 Through 15-03-2017",

}

TY - JOUR

T1 - Welcome

AU - Cline, Brian T.

AU - Heinrich-Barna, Steve

AU - Wright, Peter J.

AU - Li, Hai

AU - Viswanath, Vinod

AU - Hu, Shiyan

AU - Wesling, Paul

AU - Qu, Gang

AU - Ghosh, Swaroop

AU - Iranmanesh, Ali A.

PY - 2017/5/2

Y1 - 2017/5/2

UR - https://www.scopus.com/pages/publications/85019637754

UR - https://www.scopus.com/pages/publications/85019637754#tab=citedBy

U2 - 10.1109/ISQED.2017.7918277

DO - 10.1109/ISQED.2017.7918277

M3 - Editorial

AN - SCOPUS:85019637754

SN - 1948-3287

JO - Proceedings - International Symposium on Quality Electronic Design, ISQED

JF - Proceedings - International Symposium on Quality Electronic Design, ISQED

M1 - 7918277

T2 - 18th International Symposium on Quality Electronic Design, ISQED 2017

Y2 - 14 March 2017 through 15 March 2017

ER -

Welcome

All Science Journal Classification (ASJC) codes

Access to Document

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Cite this