Keyphrases
Ambient Conditions
10%
Annulus
10%
Atomic Force Microscopy
10%
Attenuated Total reflectance-Fourier Transform Infrared Spectroscopy (ATR-FTIR)
10%
Bridge Formation
10%
Contact Area
100%
Contact Layer
100%
Formation Model
10%
Friction
100%
Friction Force
10%
Humid Environment
100%
Humidity
100%
Humidity Dependence
20%
Infrared Spectroscopy Analysis
10%
Interfacial Chemistry
10%
Interfacial Contact
10%
Interfacial Parameters
10%
Layered Structure
100%
Mathematical Model
10%
Oxide Surfaces
20%
Role of Water
10%
Silica Spheres
10%
Silica Surface
10%
Silicon Oxide
100%
Sliding Condition
10%
Sliding Velocity
10%
Thermally Activated Processes
10%
Volume Dependence
10%
Water Bridge
10%
Water Condensation
10%
Water Layer
100%
Engineering
Adsorbed Layer
10%
Ambient Condition
10%
Atomic Force Microscopy
10%
Attenuated Total Reflection Infrared Spectroscopy
10%
Contact Area
100%
Critical Role
10%
Dynamic Condition
10%
Friction Force
10%
Humid Environment
100%
Layer Structure
100%
Relative Humidity
100%
Silicon Oxide
100%
Sliding Condition
10%
Sliding Speed
10%
Material Science
Atomic Force Microscopy
25%
Contact Area
100%
Infrared Spectroscopy
25%
Oxide Compound
100%
Oxide Surface
50%
Silicon
100%
Silicon Dioxide
50%
Solid Water
100%
Food Science
Atomic Force Microscopy
100%
Infrared Spectroscopy
100%