Abstract
High groove density reflection gratings placed at grazing incidence in the extreme off-plane mount offer increased performance over conventional in-plane mounts in the x-ray. We present initial off-plane efficiency test results from the grating evaluation facility at the University of Colorado. The test gratings are holographically ruled, ion-etched gratings with radial groove profiles that were developed and fabricated by Jobin-Yvon Inc.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 492-498 |
| Number of pages | 7 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5168 |
| DOIs | |
| State | Published - 2004 |
| Event | Optics for EUV, X-Ray, and Gamma-Ray Astronomy - San Diego, CA, United States Duration: Aug 4 2003 → Aug 7 2003 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
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