X-Ray photoelectron spectroscopic studies of ruthenium-oxygen surfaces

K. S. Kim; N. Winograd

doi:10.1016/0021-9517(74)90184-5

X-Ray photoelectron spectroscopic studies of ruthenium-oxygen surfaces

K. S. Kim, N. Winograd

Materials Research Institute (MRI)

Research output: Contribution to journal › Article › peer-review

356 Scopus citations

Abstract

The technique of X-ray photoelectron spectroscopy (XPS) has been used to study the complex surface chemistry of the ruthenium-oxygen system as a function of temperature and under the influence of Ar⁺ and O₂⁺ ion-bombardment. Interaction of molecular oxygen and O₂⁺ ions with metallic ruthenium produced two forms of oxygen which are not attributable to RuO₂, RuO₃ and RuO₄. A variety of species has been identified on RuO₂. On anhydrous RuO₂ we found a surface layer of RuO₃ present as a gross defect structure of RuO₂. On commercially available hydrated samples, both the XPS signal for the oxide and for the water could be observed. In addition, a carbon contamination indicated from a mass spectral analysis and microanalysis was characterized as RuOCO₃. In general the XPS approach was found to be valuable in monitoring the surface concentrations of these species and thus in characterizing the chemical composition of this catalyst surface.

Original language	English (US)
Pages (from-to)	66-72
Number of pages	7
Journal	Journal of Catalysis
Volume	35
Issue number	1
DOIs	https://doi.org/10.1016/0021-9517(74)90184-5
State	Published - Oct 1974

All Science Journal Classification (ASJC) codes

Catalysis
Physical and Theoretical Chemistry

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10.1016/0021-9517(74)90184-5

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@article{1a5420fd4724487089ba50a5b1702469,

title = "X-Ray photoelectron spectroscopic studies of ruthenium-oxygen surfaces",

abstract = "The technique of X-ray photoelectron spectroscopy (XPS) has been used to study the complex surface chemistry of the ruthenium-oxygen system as a function of temperature and under the influence of Ar+ and O2+ ion-bombardment. Interaction of molecular oxygen and O2+ ions with metallic ruthenium produced two forms of oxygen which are not attributable to RuO2, RuO3 and RuO4. A variety of species has been identified on RuO2. On anhydrous RuO2 we found a surface layer of RuO3 present as a gross defect structure of RuO2. On commercially available hydrated samples, both the XPS signal for the oxide and for the water could be observed. In addition, a carbon contamination indicated from a mass spectral analysis and microanalysis was characterized as RuOCO3. In general the XPS approach was found to be valuable in monitoring the surface concentrations of these species and thus in characterizing the chemical composition of this catalyst surface.",

author = "Kim, {K. S.} and N. Winograd",

note = "Funding Information: The authors thank the National Science Foundation (Grant No. GP-37017X and Materials Research Program Grant No. GH-33574Al) and the Air Force Office of Scientific Research (Grant No. AFOSR-72-2238) for financial support. The authors also greatly appreciate the assistance of Jon Amy and William Baitinger for setting up the instrument ESCA facility and for their many helpful discussions. The single crystal of RuO, was generously provided by G. L. Fuller and R. W. Vest who also provided the TGA and DTA data.",

year = "1974",

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doi = "10.1016/0021-9517(74)90184-5",

language = "English (US)",

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pages = "66--72",

journal = "Journal of Catalysis",

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AU - Kim, K. S.

AU - Winograd, N.

N1 - Funding Information: The authors thank the National Science Foundation (Grant No. GP-37017X and Materials Research Program Grant No. GH-33574Al) and the Air Force Office of Scientific Research (Grant No. AFOSR-72-2238) for financial support. The authors also greatly appreciate the assistance of Jon Amy and William Baitinger for setting up the instrument ESCA facility and for their many helpful discussions. The single crystal of RuO, was generously provided by G. L. Fuller and R. W. Vest who also provided the TGA and DTA data.

PY - 1974/10

Y1 - 1974/10

N2 - The technique of X-ray photoelectron spectroscopy (XPS) has been used to study the complex surface chemistry of the ruthenium-oxygen system as a function of temperature and under the influence of Ar+ and O2+ ion-bombardment. Interaction of molecular oxygen and O2+ ions with metallic ruthenium produced two forms of oxygen which are not attributable to RuO2, RuO3 and RuO4. A variety of species has been identified on RuO2. On anhydrous RuO2 we found a surface layer of RuO3 present as a gross defect structure of RuO2. On commercially available hydrated samples, both the XPS signal for the oxide and for the water could be observed. In addition, a carbon contamination indicated from a mass spectral analysis and microanalysis was characterized as RuOCO3. In general the XPS approach was found to be valuable in monitoring the surface concentrations of these species and thus in characterizing the chemical composition of this catalyst surface.

AB - The technique of X-ray photoelectron spectroscopy (XPS) has been used to study the complex surface chemistry of the ruthenium-oxygen system as a function of temperature and under the influence of Ar+ and O2+ ion-bombardment. Interaction of molecular oxygen and O2+ ions with metallic ruthenium produced two forms of oxygen which are not attributable to RuO2, RuO3 and RuO4. A variety of species has been identified on RuO2. On anhydrous RuO2 we found a surface layer of RuO3 present as a gross defect structure of RuO2. On commercially available hydrated samples, both the XPS signal for the oxide and for the water could be observed. In addition, a carbon contamination indicated from a mass spectral analysis and microanalysis was characterized as RuOCO3. In general the XPS approach was found to be valuable in monitoring the surface concentrations of these species and thus in characterizing the chemical composition of this catalyst surface.

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X-Ray photoelectron spectroscopic studies of ruthenium-oxygen surfaces

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