@inproceedings{0277abc9ea604b60bbfd06590df4bfbd,
title = "X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry: A Multitechnique Approach to Surface Analysis",
abstract = "The combination of X-ray photoelectron spectroscopy (XPS) with secondary ion mass spectroscopy (SIMS) promises to provide a powerfiil new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, we have tested our ultrahigh vacuum XPS/SIMS system to characterize a variety of metal, alloy, and metal oxygen surfaces. We report on the examination of clean silver surfaces where ions of clusters up to Agn + where n = 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen. In general, we have tried to illustrate the advantages of this combined technique.",
author = "A. Shepard and Hewitt, {R. W.} and Baitinger, {W. E.} and Slusser, {G. J.} and Nicholas Winograd and Ott, {G. L.} and Delgass, {W. N.}",
note = "Publisher Copyright: {\textcopyright} 1978 ASTM International. All rights reserved.; 1977 Symposium on Progress in Quantitative Surface Analysis ; Conference date: 02-03-1977 Through 03-03-1977",
year = "1978",
doi = "10.1520/STP25608S",
language = "English (US)",
series = "ASTM Special Technical Publication",
publisher = "ASTM International",
pages = "187--203",
editor = "Mclntyre, {N. S.}",
booktitle = "Quantitive Surface Analysis of Materials",
}