X-ray Scattering Measurements of Helium Adsorption into Silica Aerogel

  • L. B. Lurio
  • , N. Mulders
  • , M. Paetkau
  • , M. Lee
  • , S. G.J. Mochri
  • , M. H.W. Chan

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

We have performed simultaneous adsorption isotherm and small angle x-ray scattering (SAXS) measurements of 4He adsorption into 98% porous aerogel at 3.5K. Measurements indicate a two phase coexistence at vapor pressures slightly below the bulk liquid-vapor equilibrium point. SAXS data are interpreted according to a model which consists of the coexistence of a film phase where the aerogel strands are coated with a liquid film and a filled-pore phase were the pores defined by neighboring strands are filled with liquid.

Original languageEnglish (US)
Pages (from-to)591-596
Number of pages6
JournalJournal of Low Temperature Physics
Volume121
Issue number5-6
DOIs
StatePublished - 2000

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • General Materials Science
  • Condensed Matter Physics

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