TY - GEN
T1 - Zero-load friction at nanowire-silicon interfaces
AU - Manoharan, Mohan
AU - Haque, Aman
PY - 2008
Y1 - 2008
N2 - The dominance of adhesive forces at the nanoscale implies that significant friction forces can be generated at the interface even with no externally applied normal load. We have nanofabricated an adhesion-friction force sensor to characterize friction in zinc oxide nanowires on silicon substrates. Experimental results show static friction coefficients for zero externally applied normal load can be as high as 45. This behavior is observed to be strongly influenced by the ambient conditions and we propose that the presence of molecularly thin moisture layers is responsible for the observed pseudo-static friction. The findings of this study will provide valuable input to nanoscale interfacial systems such as nanowires and nanotube based sensors and nanocomposites.
AB - The dominance of adhesive forces at the nanoscale implies that significant friction forces can be generated at the interface even with no externally applied normal load. We have nanofabricated an adhesion-friction force sensor to characterize friction in zinc oxide nanowires on silicon substrates. Experimental results show static friction coefficients for zero externally applied normal load can be as high as 45. This behavior is observed to be strongly influenced by the ambient conditions and we propose that the presence of molecularly thin moisture layers is responsible for the observed pseudo-static friction. The findings of this study will provide valuable input to nanoscale interfacial systems such as nanowires and nanotube based sensors and nanocomposites.
UR - http://www.scopus.com/inward/record.url?scp=81155154356&partnerID=8YFLogxK
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U2 - 10.1115/DETC2008-49818
DO - 10.1115/DETC2008-49818
M3 - Conference contribution
AN - SCOPUS:81155154356
SN - 9780791843284
T3 - Proceedings of the ASME Design Engineering Technical Conference
SP - 535
EP - 538
BT - ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2008
T2 - ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2008
Y2 - 3 August 2008 through 6 August 2008
ER -